Faster, Smaller, Stronger, Brighter ‐ Advances in Scanning Probe Techniques

Since their invention in the 1980s, scanning probe microscopy (SPM) methods have become a vital tool for atomic-scale imaging. Remarkably, these techniques, most prominently scanning tunneling microscopy (STM) and atomic force microscopy (AFM), have evolved far beyond the concept of pure imaging devices and nowadays feature a full physico-chemical lab at the nanoscale. The ability to control single atoms or molecules, probe forces between them and study their interactions with electromagnetic fields in both static and time-resolved fashion allows studies of physical processes with unprecedented resolution.

The aim of the WEH seminar ’Faster, smaller, stronger, brighter - Advances in Scanning Probes Techniques’ is to pedagogically present the recent progress in this rapidly progressing field and provide a platform for extended discussions profitable especially for the younger researchers in the community.

The conference language will be English. The Wilhelm and Else Heraeus-Foundation bears the cost of full-board accommodation for all participants.